By Seung-seok Lee, Joon Hyun Lee, Ik-keun Park, Sung-jin Song, Man-Yong Choi
This quantity contains papers awarded on the 2d foreign convention on complex Nondestructive review (ANDE 2007) held in Busan, Korea, on October 17-19, 2007. a few of the first-class papers incorporated during this e-book convey the present kingdom of nondestructive applied sciences, that are experiencing quick development with the mixing of rising applied sciences in a variety of fields. As such, this quantity offers an road for either experts and students to proportion their rules and the result of their findings within the box of nondestructive assessment.
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Extra info for Advanced nondestructive evaluation II: proceedings of the International Conference on ANDE 2007, the 2nd International Conference on Advanced Nondestructive Testing
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H. E. , J. Dent. 30, 283-290 (2002). C. L. , Comp. Meth. & Prog. In Biomed. 59, 187-195 (1999). H. , Oral physiology, Gomoonsa (2003). H. J. Lee, K. J. , I, 171-172 (2006). , Belick Street Santa Clara, CA 95045-2404, USA HYOSUNG CHO Department of Radiological Science, Yonsei University, Jangjeon, Geumjeong Wonju 220-710, Republic of Korea JUNG-MIN KIM College of Health Science, Korea University, Jeuneung, Seongbuk Seoul 136-703, Republic of Korea For the better design and usage of CMOS (complementary metal-oxide-semiconductor) flat-panel detectors in digital x-ray radiography, we have theoretically evaluated the spatial-frequency-dependent detective quantum efficiency, DQE( f ), by using the cascaded linear-systems theory.
This theoretical approach is useful tool for the understanding of a developed imaging system and be helpful for the better design or optimizing a developing system. 1. Introduction Although the technology in digital radiography detectors has been matured, there is not a universal detector to cover all the imaging tasks. Thus, the optimization * This work was supported by the Korea Science and Engineering Foundation (KOSEF) grant funded by the Korea government (MOST) (Grant No. R01-2006-000-10233-0).